Opis: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Richard Haight

Nanoscience and nanotechnology is an exciting and vibrant field of research. This new handbook, intended for researchers, engineers and advanced graduate students in all areas of nanoscience, is written by eminent scientists and experts who are pushing the forefront of instrumentation and developing key techniques for the study of atomic structural, optical and electronic properties of nanostructured semiconductor materials. This handbook will be a key resource for all researchers in nanoscience and nanomaterials interested in learning about the most important techniques for unlocking the detailed science and properties of nanostructures.Atom Probe Tomography; Plasmon Dynamics of Nanostructured Surfaces; Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures; Nanomembranes; Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss; Rayleigh Scattering from Carbon Nanotubes; Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces; Scanning Probe Microscopy of GaN Based Structures; Time Domain Thermoreflectance for Thermal Characterization of Nanostructures; X-Ray Studies of Nanostructures; Single Nanowire Photoelectron Spectroscopy; Ultra-High Vacuum Transmission Electron Microscopy; Synthesis and Studies of Low-Dimensional Structures; Raman Spectroscopy of Carbon Nanotubes; Scanning Electron Microscopy for Characterization of Semiconducting Nanowires; X-Ray Diffraction for Stress Determination in Nanostructures.

Szczegóły: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Richard Haight

Tytuł: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization
Autor: Richard Haight
Producent: World Scientific Publishing Co Ltd
ISBN: 9789814322805
Rok produkcji: 2011
Ilość stron: 1050
Oprawa: Twarda
Waga: 1.38 kg

Recenzje: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Richard Haight